Yoshihiro Midoh: search on Z-Library

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1

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Non-electrical-contact LSI failure analysis using non-bias laser terahertz emission microscope

Nikawa, Kiyoshi, Yamashita, Masatsugu, Matsumoto, Toru, Otani, Chiko, Tonouchi, Masayoshi, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji

Year:

2011

Language:

english

File:

PDF, 2.41 MB

english, 2011

2

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.57 MB

english, 2011

3

Laser THz emission microscope as a novel tool for LSI failure analysis

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 2.53 MB

english, 2009

4

3D analysis of benign positional nystagmus due to cupulolithiasis in posterior semicircular canal

Imai, Takao, Takeda, Noriaki, Ito, Mahito, Sekine, Kazunori, Sato, Go, Midoh, Yoshihiro, Nakamae, Koji, Kubo, Takeshi

Journal:

Acta Oto-Laryngologica

Year:

2009

Language:

english

File:

PDF, 167 KB

english, 2009

5

Statistical optimization of Canny edge detector for measurement of fine line patterns in SEM image

Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Fujioka, Hiromu

Journal:

Measurement Science and Technology

Year:

2005

Language:

english

File:

PDF, 571 KB

english, 2005

6

SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Boundary extraction in the SEM cross-section of LSI by multiple Gaussian filtering

Midoh, Yoshihiro, Nakamae, Koji, Fujioka, Hiromu, Harding, Kevin G.

Year:

2004

Language:

english

File:

PDF, 437 KB

english, 2004

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 23 February 2014)] Alternative Lithographic Technologies VI - A shape-modification strategy of electron-beam direct writing considering circuit performance in LSI interconnects

Resnick, Douglas J., Bencher, Christopher, Midoh, Yoshihiro, Osaki, Atsushi, Nakamae, Koji

Year:

2014

Language:

english

File:

PDF, 4.72 MB

english, 2014

8

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Alternative Lithographic Technologies V - A dose modification strategy of electron beam direct writing considering TDDB reliability in LSI interconnects

Midoh, Yoshihiro, Tong, William M., Resnick, Douglas J., Osaki, Atsushi, Nakamae, Koji

Year:

2013

Language:

english

File:

PDF, 1.62 MB

english, 2013

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Defect inspection using a high-resolution pattern image obtained from multiple low-resolution images of the same pattern on an observed noisy SEM image

Takashima, Masahiko, Allgair, John A., Raymond, Christopher J., Midoh, Yoshihiro, Nakamae, Koji

Year:

2008

Language:

english

File:

PDF, 693 KB

english, 2008

10

Visual Target Strategies in Infantile Nystagmus Patients With Horizontal Jerk Waveform

Imai, Takao, Takimoto, Yasumitsu, Okumura, Tomoko, Higashi-Shingai, Kayoko, Takeda, Noriaki, Kitamura, Koji, Kalubi, Bukasa, Fujikado, Takashi, Hirota, Masakazu, Midoh, Yoshihiro, Nakamae, Koji, Inoha

Journal:

Frontiers in Neurology

Year:

2018

Language:

english

File:

PDF, 958 KB

english, 2018

11

SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Machine Vision Applications in Industrial Inspection XI - Fine structure measurement in the SEM cross section of LSI using the Canny edge detector

Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Fujioka, Hiromu, Hunt, Martin A., Price, Jeffery R.

Year:

2003

Language:

english

File:

PDF, 606 KB

english, 2003

12

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Intelligent Robots and Computer Vision XX: Algorithms, Techniques, and Active Vision - Boundary extraction in the SEM cross-section of LSI

Nakamae, Koji, Midoh, Yoshihiro, Miura, Katsuyoshi, Fujioka, Hiromu, Casasent, David P., Hall, Ernest L.

Year:

2001

Language:

english

File:

PDF, 310 KB

english, 2001

13

SPIE Proceedings [SPIE Optics East 2007 - Boston, MA (Sunday 9 September 2007)] Wavelet Applications in Industrial Processing V - Line edge roughness measurement of nanostructures in SEM metrology by using statistically matched wavelet

Midoh, Yoshihiro, Truchetet, Frédéric, Laligant, Olivier, Nakamae, Koji, Fujioka, Hiromu

Year:

2007

Language:

english

File:

PDF, 395 KB

english, 2007

14

THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis

Yamashita, Masatsugu, Otani, Chiko, Matsumoto, Toru, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Nikawa, Kiyoshi, Kim, Sunmi, Murakami, Hironaru, Tonouchi, Masayoshi

Journal:

Year:

2011

Language:

english

File:

PDF, 1.44 MB

english, 2011

15

SPIE Proceedings [SPIE Optics East 2006 - Boston, MA (Sunday 1 October 2006)] Wavelet Applications in Industrial Processing IV - A comparison of wavelet multiresolution analysis and scale-space edge detection for lithography metrology

Midoh, Yoshihiro, Truchetet, Frédéric, Laligant, Olivier, Nakamae, Koji, Fujioka, Hiromu

Year:

2006

Language:

english

File:

PDF, 749 KB

english, 2006

16

[IEEE 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves (IORMMW-THz 2009) - Busan, South Korea (2009.09.21-2009.09.25)] 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves - Development of an LTEM prototype system for LSI failure analysis

Yamashita, Masatsugu, Otani, Chiko, Sunmi, Kim, Murakmai, Hironaru, Tonouchi, Masayoshi, Matsumoto, Toru, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Nikawa, Kiyoshi

Year:

2009

Language:

english

File:

PDF, 711 KB

english, 2009

17

Accuracy improvement of phase estimation in electron holography using noise reduction methods

Midoh, Yoshihiro, Nakamae, Koji

Journal:

Year:

2020

Language:

english

File:

PDF, 2.03 MB

english, 2020

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